INFANT MORTALITY MODELLING FOR VLSI DEVICES USING GRAPHICAL ESTIMATION.

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  • Additional Information
    • Author-Supplied Keywords:
      Burn-in
      Goldthwaite
      Infant mortality
      Lognormal
      Modelling
      VLSI
      Weibull
    • NAICS/Industry Codes:
      423690 Other Electronic Parts and Equipment Merchant Wholesalers
    • Abstract:
      This paper presents a practical methodology for the routine analysis of VLSI infant mortality data. Device families are modelled using established graphical parameter estimation techniques, and the model parameters are applied to individual device types within the family. Burn-in requirements are calculated to achieve a desired early life reliability level. A technical summary of the methods is presented, and a small data set is analysed as an example. The analysis results from three large device families are also presented. [ABSTRACT FROM AUTHOR]
    • Abstract:
      Copyright of Quality & Reliability Engineering International is the property of John Wiley & Sons, Inc. and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
    • ISSN:
      0748-8017
    • Accession Number:
      10.1002/qre.4680060508
    • Accession Number:
      12788739
  • Citations
    • ABNT:
      STOLTZE, P. L. Infant Mortality Modelling for Vlsi Devices Using Graphical Estimation. Quality & Reliability Engineering International, [s. l.], v. 6, n. 5, p. 345–356, 1990. DOI 10.1002/qre.4680060508. Disponível em: http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=http://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=a9h&AN=12788739&authtype=sso&custid=s5834912. Acesso em: 27 jan. 2020.
    • AMA:
      Stoltze PL. Infant Mortality Modelling for Vlsi Devices Using Graphical Estimation. Quality & Reliability Engineering International. 1990;6(5):345-356. doi:10.1002/qre.4680060508.
    • APA:
      Stoltze, P. L. (1990). Infant Mortality Modelling for Vlsi Devices Using Graphical Estimation. Quality & Reliability Engineering International, 6(5), 345–356. https://doi.org/10.1002/qre.4680060508
    • Chicago/Turabian: Author-Date:
      Stoltze, Paul L. 1990. “Infant Mortality Modelling for Vlsi Devices Using Graphical Estimation.” Quality & Reliability Engineering International 6 (5): 345–56. doi:10.1002/qre.4680060508.
    • Harvard:
      Stoltze, P. L. (1990) ‘Infant Mortality Modelling for Vlsi Devices Using Graphical Estimation’, Quality & Reliability Engineering International, 6(5), pp. 345–356. doi: 10.1002/qre.4680060508.
    • Harvard: Australian:
      Stoltze, PL 1990, ‘Infant Mortality Modelling for Vlsi Devices Using Graphical Estimation’, Quality & Reliability Engineering International, vol. 6, no. 5, pp. 345–356, viewed 27 January 2020, .
    • MLA:
      Stoltze, Paul L. “Infant Mortality Modelling for Vlsi Devices Using Graphical Estimation.” Quality & Reliability Engineering International, vol. 6, no. 5, Nov. 1990, pp. 345–356. EBSCOhost, doi:10.1002/qre.4680060508.
    • Chicago/Turabian: Humanities:
      Stoltze, Paul L. “Infant Mortality Modelling for Vlsi Devices Using Graphical Estimation.” Quality & Reliability Engineering International 6, no. 5 (November 1990): 345–56. doi:10.1002/qre.4680060508.
    • Vancouver/ICMJE:
      Stoltze PL. Infant Mortality Modelling for Vlsi Devices Using Graphical Estimation. Quality & Reliability Engineering International [Internet]. 1990 Nov [cited 2020 Jan 27];6(5):345–56. Available from: http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=http://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=a9h&AN=12788739&authtype=sso&custid=s5834912