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Academic Journal

Electrically injected quantum-dot photonic crystal microcavity light sources.

  • Source: Optics Letters; 1/15/2006, Vol. 31 Issue 2, p232-234, 3p, 1 Diagram, 2 Graphs

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Academic Journal

Ion detection with photonic crystal microcavities.

  • Source: Optics Letters; 10/1/2005, Vol. 30 Issue 19, p2578-2580, 3p, 3 Graphs

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Academic Journal

Electrically injected quantum-dot photonic crystal microcavity light sources.

  • Authors : Topol'ancik J; Solid State Electronics Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor 48109-2122, USA.; Chakravarty S

  • Source: Optics Letters [Opt Lett] 2006 Jan 15; Vol. 31 (2), pp. 232-4.Publisher: Optical Society of America Country of Publication: United States NLM ID: 7708433 Publication Model: Print Cited

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Academic Journal

Tomographic extreme-ultraviolet spectrographs: TESS.

  • Authors : Cotton DM; Center for Space Physics and the Department of Astronomy, Boston University, 725 Commonwealth Avenue, Boston, Massachusetts 02215, USA. ; Stephan A

  • Source: Applied Optics [Appl Opt] 2000 Aug 01; Vol. 39 (22), pp. 3991-9.Publisher: Optical Society of America Country of Publication: United States NLM ID: 0247660 Publication Model: Print Cited

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Academic Journal

Self-compensating, all-reflection interferometer.

  • Source: Applied Optics [Appl Opt] 1994 May 01; Vol. 33 (13), pp. 2596-607.Publisher: Optical Society of America Country of Publication: United States NLM ID: 0247660 Publication Model: Print Cited

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Academic Journal

Single-element imaging spectrograph.

  • Source: Applied Optics [Appl Opt] 1994 Apr 01; Vol. 33 (10), pp. 1958-62.Publisher: Optical Society of America Country of Publication: United States NLM ID: 0247660 Publication Model: Print Cited

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Academic Journal

Extinction cross sections and albedos for particles with very rough surfaces.

  • Source: Applied Optics [Appl Opt] 1986 Aug 01; Vol. 25 (15), pp. 2530.Publisher: Optical Society of America Country of Publication: United States NLM ID: 0247660 Publication Model: Print Cited

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Editorial & Opinion

Long term variability of transmission of thin In-Sn and Sn-C films for EUV instrumentation.

  • Source: Applied Optics [Appl Opt] 1982 Oct 01; Vol. 21 (19), pp. 3417-8.Publisher: Optical Society of America Country of Publication: United States NLM ID: 0247660 Publication Model: Print Cited

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  • 1-10 of  23 results for ""Chakrabarti, S.""